DTG5274 - Источник логических сигналов

Скорость передачи данных до 2,7 Гб/с; от 1 до 16 каналов данных (основных и подчиненных), до 1000 благодаря синхронизации с помощью тактовых импульсов; лучшее в своем классе разрешение по задержке и диапазону; гибкая платформа, сочетающая возможности генератора данных, генератора импульсов и источника постоянного тока; модульная архитектура, способствующая защите вложений пользователей и позволяющая расширять возможности прибора по мере роста потребностей; глубина сложных моделей данных до 64 Мбит на канал.

DTG5000 Series Allows Engineers to Design to a Higher Standard

The DTG5000 Series combines the power of a data generator with the capabilities of a pulse generator in a versatile, benchtop form factor, shortening the duration of complex test procedures and simplifying the generation of low-jitter, high-accuracy clock signals or serial data across multiple channels.

Features & Benefits

• Versatile Platform Combines Features of Data Generator, Pulse Generator, and DC Source
  
• Up to 3.35 Gb/s Data Rate
  
• From 1 to 96 Data Channels (Master/Slave)
  
• Class Leading Delay Resolution of 0.2 ps (DTG5274/DTG5334), 1 ps (DTG5078), up to 600 ns of Total Delay
  
• Modular Architecture Helps to Protect Your Investment and Allows the Instrument to Expand With Your Growing Needs
  
• Advanced Control Over Signal Parameters to Meet Most Current Testing Needs, Including Stressed Eye Generation
  
  • External Jitter Injection (DTGM31, DTGM32 Modules)
    
  • Level Control with 5 mV Resolution
    
• Easy to Use and Learn Shortens Time to Test
  
  • Easily Configure with Plug-in Modules
    
  • Intuitive Windows User Interface
    
  • Bench Top Form Factor
    
  • Integrated PC Supports Network Integration and Built-in CD-ROM, LAN, Floppy Drive, USB Ports
    
• Up to 64 Mb Pattern Depth Per Channel for Complex Data Patterns
  

Applications

• Semiconductor Device Functional Test and Characterization
  
  • Support for Semiconductor Technologies from TTL to LVDS
    
  • Initial Verification and Debugging, Comprehensive Characterization, Manufacturing, and Quality Control
    
• Compliance and Interoperability Testing to Emerging Standards
  
  • PCI-Express Gen1:2.5 Gbps
    
  • Serial ATA Gen1/2:1.5 Gbps/3 Gbps
    
  • InfiniBand 2.5 Gbps
    
  • XAUI: 3.125 Gbps
    
  • HDMI: Version 1.3 / DVI
    
• Magnetic and Optical Storage Design
  
  • Research, Development, and Test of Next-generation Devices (HDD, DC/DVD, Blue-ray)
    
• Data Conversion Device Design
  
  • Characterization and Test of Next-generation D/A Convertors
    
• Imaging Sensor Device Design
  
  • Characterization and Functional Testing of Next-generation Imaging Devices (CCD/CMOS)
    
• Jitter Transfer and Jitter Tolerance Testing
  

New serial data standards, expanding networks, and ubiquitous computing continually redefine the cutting-edge of technology. The design engineer is challenged to economize without sacrificing performance.

The DTG5000 Series combines the power of a data generator with the capabilities of a pulse generator in a versatile, bench-top form factor, shortening the duration of complex test procedures and simplifying the generation of low-jitter, high-accuracy clock signals, parallel or serial data across multiple channels. Its modular platform allows you to easily configure the performance of the instrument to your existing and emerging needs to minimize equipment costs. Three mainframes and five plug-in output modules combine to cover a range of applications from legacy devices to the latest technologies. In addition, eight low-current, independently-controlled DC outputs can substitute for external power supplies. Each mainframe incorporates a full compliment of auxiliary input and output channels to easily integrate with other instruments, such as oscilloscopes and logic analyzers, to create a flexible and powerful lab.